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Participants will develop the ability to interpret yield data, identify defect trends, and conduct systematic failure analysis in semiconductor devices. They will learn how to apply reliability testing methods, diagnose device-level failures, and implement corrective actions that enhance product reliability and manufacturing yield.
Participants will be able to build and integrate Python-based Robot Framework automation for functional, integration, and regression testing, enhance test coverage for embedded and connected systems, and incorporate automation into quality pipelines to improve product reliability and speed to market.